1.1 Features
- GaN-on-Silicon E-mode HEMT technology
- Very low gate charge
- Ultra-low on Resistance
- Very small package size
- Zero reverse recovery charge
100V Enhancement-mode GaN Power Transistor
GaN-on-Silicon enhancement mode high-electron-mobility-transistor(HEMT) in Solder Bar WLCSP with 3.5mm x 2.13mm package size.
Innoscience’s E-mode GaNFETs were subjected to a variety of reliability test under the condition referenced to typical for silicon-based power MOSFETs.These test items and results were shown as below:
Platform (S100E2.0) | ||||
---|---|---|---|---|
Product (INN100W032A) | ||||
Test Items | Test Conditions | Sample Size (Unit x Lot) | #Fail | Result |
MSL1 | T=85°C, RH=85%, 3 x reflow | 0 Fail | 25 x 3 | Pass |
HTRB | T=150°C, VD=80V | 0 Fail | 77 x 3 | Pass |
HTGB | T=150°C, VG=5.5V | 0 Fail | 77 x 3 | Pass |
BLTC | -40 to +125°C, Air | 0 Fail | 77 x 3 | Pass |
H3TRB | T=85°C, RH=85%, VD=80V | 0 Fail | 77 x 3 | Pass |
HAST | T=130°C, RH=85%, VD=42V | 0 Fail | 77 x 3 | Pass |
HTSL | T=150°C | 0 Fail | 77 x 3 | Pass |
HTOL | LLC, Vin=60V, Fsw=1MHz, Tj>125°C | 0 Fail | 10 x 3 | Pass |
HBM | All Pins | 0 Fail | 3 x 1 | Class 1C |
CDM | All Pins | 0 Fail | 3 x 1 | Class C3 |
Parameter | Value |
---|---|
VDS,max | 100V |
RDS(on),max @ VGS = 5V | 3.2mΩ |
QG,typ @ VDS = 50V | 9.2nC |
ID,pulse | 230A |
QOSS @ VDS = 50V | 50nC |